Motivation & Aim

Motivation

In nano-science and nano-technology, there is a need to apply fast characterization approaches in order to reveal the structure of small objects in the nm range. Small- Angle X-ray Scattering is a well established analytical technique to characterize particle size, distribution and shape in various kinds of biological, pharmaceutical, polymer, fiber samples and nanomaterials. Structural details of nano-structured surfaces can be elaborated by means of the novel GISAXS technique. This method provides complimentary information to electron microscopy or AFM. Due to progress in X-ray laboratory instruments and evaluation techniques, SAXS and GISAXS are becoming increasingly popular and are used for more and more applications.

Aim

The aim of this workshop is to provide an overview about the latest scientific achievements and instrumentation developments in SAXS and GISAXS. Topics dealing with classical SAXS, in situ timeresolved experiments and advanced surface characterization techniques will be covered by invited speakers. The meeting will provide the ground to exchange experiences in the wide spectrum of SAXS and GISAXS applications. Moreover, a practical training on SAXS and GISAXS techniques and data evaluation will be provided.

The workshop is addressed to beginners, as well as experts in materials research.

List of confirmed speakers