Material characterisation by means of scanning electron microscopy (SEM) (e.g. microstructure assessment, phase composition)
3D characterisation of component and fracture surfaces incl. determination of local chemical composition and damage
3D microstructure tomography based on grain orientation or chemical composition
Target preparation of atom probe specimens from arbitrary areas of samples (bulk materials and thin films) for subsequent analysis in cooperation with our research partners
Target preparation of thin films for transmission electron microscopy (TEM)
Production of micro specimens for mechanical in-situ tests with different geometries (e.g. cuboid, cylinder or micro tensile and bending specimens) for subsequent testing in cooperation with our research partners
Introduction of small crack-like defects (in the sub-µm to µm range) for investigation of the behaviour of short cracks
